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- 2- or 4-port, 50 ohm, S-parameter test set
- Improve accuracy, yield and margins with wide dynamic range 130 dB, fast measurement speed 8 ms and excellent temperature stability 0.005 dB/°C
- Obtain design confidence through complete characterization of high-speed serial interconnects with enhanced time domain analysis option
- Protect your investment with upgradability across all of the options